Morphologic Analysis SEM+EDS
SCANNING ELECTRON MICROSCOPE
The scanning electron microscope allows to analyze at a microscopic level the sample morphology of an element by verifying its characteristics. Coupled to an EDS (Energy Dispersive X-RAY Spectroscopy), it is used to characterize in a qualitative way of solids substances and to carry elemental analyses. The SEM-EDS becomes fundamental to obtain both a qualitative and quantitative analysis of the alloys and of the purity of the raw materials.